CI provides test benches (or stations) for Electro-Optical (E-O) systems composed of multiple sensors (or channels).
These benches are built to provide a comprehensive turnkey solution for all the sensors' testing needs of the E-O system in question.
These stations are based on MIL-Standard test equipment that can be used in all stages of the UUT's life cycle All or some of the tests listed below can be performed by a single E-O turn-key station.